Interface ElectronicsLaboratory 02: LTSPICE DAC analysis instructionsProf. Jörg VollrathStart 9.11.2026 |
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The schematic shows a 8-bit ADC DAC System. Download the circuit. This is the starting point for this laboratory. Implement the circuit and simulate a ramp and a sine signal. Extract INL, DNL and SNR. |
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The SH circuit SampleHold.asc uses CD4007 transistors. C1 and R5 are parasitic elements. Measure INL, DNL and FFT of Vin, V1, V2 and Vout. Investigate the impact of sampling time, C1 and R5 to INL, DNL and SNR. |
| Group | Identifier | Box | Lab 02 | Group | Identifier | Box | Lab 02 |
| A11 | ***87 LT | 1 | C1=0.1pF, R5=300k | B11 | ***16 SJ | 11 | C1=0.1pF, R5=200k |
| A12 | ***13 GA | 1 | C1=0.1pF, R5=300k | B12 | ***49 TG | 11 | C1=0.1pF, R5=200k |
| A21 | ***17 KC | 2 | C1=0.1pF, R5=100k | B21 | ***87 SH | 12 | C1=0.1pF, R5=400k |
| A22 | ***83 AI | 2 | C1=0.1pF, R5=100k | B22 | ***51 PN | 12 | C1=0.1pF, R5=400k |
| A31 | ***98 DG | 3 | C1=0.05pF, R5=100k | B31 | ***93 AM | 13 | C1=0.05pF, R5=200k |
| A32 | ***08 BS | 3 | C1=0.05pF, R5=300k | B32 | ***66 SA | 13 | C1=0.05pF, R5=200k |
| A41 | ***86 MN | 4 | C1=0.05pF, R5=100k | B41 | ***22 LG | 14 | C1=0.05pF, R5=400k |
| A42 | ***02 RM | 4 | C1=0.05pF, R5=100k | B42 | ***33 TG | 14 | C1=0.05pF, R5=400k |
| A51 | ***60 SS | 5 | C1=0.5pF, R5=100k | B51 | ***68 AP | 15 | C1=0.5pF, R5=200k |
| A52 | ***06 AF | 5 | C1=0.5pF, R5=300k | B52 | ***36 SS | 15 | C1=0.5pF, R5=200k |
| A61 | ***22 PL | 6 | C1=0.5pF, R5=100k | B61 | ***07 DM | 16 | C1=0.5pF, R5=400k |
| A62 | ***14 MV | 6 | C1=0.5pF, R5=100k | B62 | ***28 MM | 16 | C1=0.5pF, R5=400k |
| A71 | ***11 BA | 7 | C1=1pF, R5=300k | B71 | ***08 DM | 17 | C1=1pF, R5=200k |
| A72 | ***64 ST | 7 | C1=1pF, R5=300k | B72 | ***62 PV | 17 | C1=1pF, R5=200k |
| A81 | ***28 MH | 8 | C1=1pF, R5=100k | B81 | ***xx XX | 18 | C1=1pF, R5=400k |
| A82 | ***28 MH | 8 | C1=1pF, R5=100k | B82 | ***xx XX | 18 | C1=1pF, R5=400k |
| A91 | ***xx XX | 9 | B91 | ***xx XX | 19 | ||
| A92 | ***xx XX | 9 | B92 | ***xx XX | 19 | ||
| AA1 | ***xx XX | 10 | BA1 | ***xx XX | 20 | ||
| AA2 | ***9A JV | 10 | BA2 | ***9B JV | 20 |
| OpAmp Voltage follower | Switch CLK coupling SampleHold C1 |
Switch RC SampleHold R5 |
| \( \frac{V_{out}}{V_{in}}=\frac{1}{1+\frac{1}{v(f)}} \) | \( dV = VDD \frac{1}{(1+\frac{C_S}{C_1})} \) | t > RC (B+1) ln(2) |


| ramp | V(node) | start | stop | step | INL min, max | DNL min, max | File name |
| 327.68m | |||||||
| 327.68m rtz |
| sine frequency | sine periods | V(node) | start | stop | step | Signal magnitude | Total noise magnitude | Harmonics | Total noise magnitude without harmonics | File name |
| 16.78466796875 | 11 |
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Investigate Errors in the R values of the 8 Bit R2R Circuit. Download the circuit. Add it to the 8 Bit ADC DAC set up. Simulate a ramp test and a sine test. Change R(last digit) by 50% and look at INL, DNL and SNR. |
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The schematic shows a 8-bit cyclic R2R DAC. The Resolution can be scaled up with a fixed number of control lines. |
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This video presents the download and run of LTSPICE files. Search for "Vollrath InEl" Open LTSPICE presentation. Go to "Scalable behavioral 4 Bit DAC", "Scalable behavioral 4 Bit ADC", "Test for 4 Bit ADC and DAC" slides and download circuits (.asc) and (.asy) presented to you after clicking on the circuit. Run the sine simulation and view V(in1),V(out). Create a pulse voltage source: V1 in1 0 PULSE(0 1 0 655.36u 655.36u 0 1310.72u) Run a ramp simulation. |
Duration 10:52 min |
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This video presents the analysis of LTSPICE simulation files. Run the ADC DAC test simulation in LTSPICE with a ramp. Extract the simulated values with Read Raw File . Use analysis buttons to:
Extract the simulated values with Read Raw File . Use the integer values for a FFT analysis. How can you extract only less 16*1024 values? Describe the changes in the FFT results? |
Duration 13:48 min |
00:28: : Read LTSPICE raw data 04:15: : Start time 0, Stop time 655.36E-6, Time step: 40.96E-6 04:58: : First data 05:50: : Map to integer 06:25: : DNL INL graph 07:13: : Histogram with smaller step size 5.12E-6 08:10: : Map to integer 08:42: : ADC histogram analysis 09:20: : Simulate sine 09:50: : Read data values 11:05: : Histogramm test 11:40: : Copy values 12:00: : ADC FFT Javascript, Fill input data field, read integer values 12:50: : SNR 11.87-(-13.89) dB = 25.76 dB ENOB = (15.76-1.76)/6.02 = 4 13:16: : Sine histogram INL and DNL
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The schematic shows a 4-bit R2R DAC. We will use it in the ADC DAC simulation to see some errors. Create a symbol and hook it up to the ADC DAC test circuit from last week. Modify the resistance values. For example 1.5k, 2.5k, 1.3k, 1.7k. Simulate a ramp test. Extract the simulated values with Read Raw File . Calculate INL, DNL with any tool. Document and discuss INL and DNL values. Simulate a sine signal test. Extract the simulated values with Read Raw File . Calculate FFT, INL, DNL with FFT webpage and paste the extracted values from LTSPICE into the input field. Document and discuss FFT, INL, DNL and SNR values. |
Duration 6:34 min |
00:34: : Include R2R DAC 01:52: : Simulate real R2R DAC 02:23: : Modify R values: R6 1.3k, R9 1.5k 03:16: : Read, mapto integer, copy values to FFT, process 04:29: : SNR 12.09-(-6.75) dB = 18.84 dB 04:55: : Ramp test 05:28: : Step 40.96E-6 06:07: : INL and DNL with error
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This video presents the analysis of LTSPICE simulation files with
a .measure statement. Run the ADC DAC test simulation in LTSPICE with a ramp. Insert SPICE directive: .meas trans OUT00 FIND V(vout) AT=81.92us After simulation "View","SPICE Error log" will show the result. Multiple measurement statements can be placed into a file. After simulation "File","Execute .MEAS script" generates the results. A 10-bit data converter should have about 16384 measurement values. Data extraction can be difficult and quite time consuming. |
Duration 5:55 min |
00:44: Measurement statement 01:35: First measurement statement: .meas trans OUT00 FIND V(vout) at t=20.48u 05:20: .meas script